Structural Effects of Ti Underlayer on CoCrPt Magnetic Films

Journal of Nanoscience and Nanotechnology

Volumn 1, Issue 3, 2001, Pages 271-273

  Sun, C J ^a,b   Chow, G M ^a   Soo, E W ^b   Wang, J P ^b   Hwu, Y K ^a,c   Cho, T S ^d   Je, J H ^e   Lee, H H ^f   Kim, J W ^f   Noh, D Y ^f  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

^b DATA STORAGE INSTITUTE   (Singapore)

^c INSTITUTE OF PHYSICS   (Taiwan)

^d Kyungpook National University   (South Korea)

^e Pohang University of Science and Technology (POSTECH)   (South Korea)

^f Gwangju Institute of Science and Technology (GIST)   (South Korea)

Author keywords

Cocrpt films; Ti underlayer; X ray scattering; XANES

Indexed keywords

CHROMIUM DERIVATIVE; LEAD; TITANIUM;

ARTICLE; ARTIFICIAL MEMBRANE; CHEMISTRY; CONFORMATION; CRYSTALLIZATION; CRYSTALLOGRAPHY; ISOLATION AND PURIFICATION; MAGNETISM; MATERIALS TESTING; METHODOLOGY; NANOTECHNOLOGY; STRUCTURE ACTIVITY RELATION;

CHROMIUM ALLOYS; CRYSTALLIZATION; CRYSTALLOGRAPHY; LEAD; MAGNETICS; MATERIALS TESTING; MEMBRANES, ARTIFICIAL; MOLECULAR CONFORMATION; NANOTECHNOLOGY; STRUCTURE-ACTIVITY RELATIONSHIP; TITANIUM;

EID: 0038497730     PISSN: 15334880     EISSN: None     Source Type: Journal    
DOI: 10.1166/jnn.2001.035     Document Type: Article

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