Structural study of CoCrPt films by anomalous x-ray scattering and extended x-ray absorption fine structure

Applied Physics Letters

Volumn 80, Issue 9, 2002, Pages 1607-1609

  Chow, G M ^a   Sun, C J ^a   Soo, E W ^b   Wang, J P ^b   Lee, H H ^c   Noh, D Y ^c   Cho, T S ^d   Je, J H ^d   Hwu, Y K ^e  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

^b DATA STORAGE INSTITUTE   (Singapore)

^c Gwangju Institute of Science and Technology (GIST)   (South Korea)

^d Pohang University of Science and Technology (POSTECH)   (South Korea)

^e INSTITUTE OF PHYSICS   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

ANOMALOUS X-RAY SCATTERING; ATOMIC ENVIRONMENT; BRAGG DIFFRACTION PEAKS; CHARACTERIZATION TECHNIQUES; CR CONCENTRATION; ELEMENTAL COMPOSITIONS; ELEMENTAL CONCENTRATIONS; EXTENDED X-RAY ABSORPTION FINE STRUCTURES; FILM COMPOSITION; LONG RANGE ORDERS; NANOSTRUCTURED FILMS; POLYCRYSTALLINE; SPUTTERING TEMPERATURE; STRUCTURAL OBSERVATIONS; STRUCTURAL STUDIES;

ABSORPTION SPECTRA; CHROMIUM; EXTENDED X RAY ABSORPTION FINE STRUCTURE SPECTROSCOPY; GRAIN BOUNDARIES; X RAY ABSORPTION; X RAY SCATTERING;

SCATTERING;

EID: 79955997159     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1457533     Document Type: Article

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