Optical properties of Si nanowires on a Si{111} surface

Materials Research Society Symposium - Proceedings

Volumn 588, Issue , 2000, Pages 99-103

  Ozaki, N ^a   Ohno, Y ^a   Takeda, S ^a  

^a OSAKA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CATHODOLUMINESCENCE; CRYSTAL DEFECTS; EMISSION SPECTROSCOPY; NANOSTRUCTURED MATERIALS; OPTICAL PROPERTIES; SEMICONDUCTING SILICON; SEMICONDUCTOR GROWTH; SURFACE STRUCTURE; TRANSMISSION ELECTRON MICROSCOPY;

CATHODOLUMINESCENCE SPECTROSCOPY; KINK; SILICON NANOWIRES; VAPOR LIQUID SOLID GROWTH;

SEMICONDUCTOR QUANTUM WIRES;

EID: 0033691752     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)

1. L.T. Canham, Appl. Phys. Lett., 57, 1046 (1990).
2. N.Ozaki, Y.Ohno and S.Takeda, Appl. Phys . Lett., 73, 3700 (1998).
3. R.S.Wagner and W.C.Ellis, Appl. Phys. Lett. 4, 89 (1964).
4. Y.Ohno and S.Takeda, Rev. Sci. Instrum. 66, 4866 (1995).
5. submitted for publication.