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note
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XRD measurement was carried out with a Phipis PQ1720 X-ray diffractionmeter with Cu Kα irradiation (λ = 1.54178 nm). TEM images were observed on a Hitachi Model H-800 transmission electron microscope under 200 kV accelerating voltage. The absorption spectra were examined on an UV-2100 Schimadzu UV-vis spectrophotometer. The PL spectrum was measured on a Hitachi 850-fluorescence spectrophotometer.
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