High temperature growth of ZnS films on bare Si and transformation of ZnS to ZnO by thermal oxidation

Applied Physics Letters

Volumn 78, Issue 5, 2001, Pages 616-618

  Yoo, Y Z ^a   Osaka, Y ^a   Fukumura, T ^a   Jin, Zhengwu ^a   Kawasaki, M ^a   Koinuma, H ^a   Chikyow, T ^b   Ahmet, P ^b   Setoguchi, A ^c   Chichibu, S F ^c  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

^b NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

^c UNIVERSITY OF TSUKUBA   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 18044403791     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1344572     Document Type: Article

References (15)

1. R. Menner, B. Dimmler, R. H. Mauch, and H. W. Schock, J. Cryst. Growth 86, 906 (1988).
2. C.-Y. Yeh, Z. W. Lu, S. Froyen, and A. Zunger, Phys. Rev. B 46, 10 086 (1992).
3. R. G. Benz, P. C. Hung, S. R. Stock, and C. J. Summers, J. Cryst. Growth 86, 303 (1988).
4. C. Giannini, T. Peluso, C. Gerardi, L. Tapfer, N. Lovergine, and L. Vasanelli, J. Appl. Phys. 77, 2429 (1995).
5. L. T. Romano, R. D. Bringans, X. Zhou, and W. P. Kirk, Phys. Rev. B 52, 11 201 (1995).
6. X. Zhou, S. Jiang, and W. P. Kirk, J. Appl. Phys. 82, 2251 (1997).
7. Y.-Z. Yoo, T. Chikyow, T. Makino, Y. Segawa, T. Fukumura, M. Kawasaki, and H. Koinuma (unpublished).
8. D. C. Reynolds, D. C. Look, B. Jogai, and T. C. Collins, Phys. Rev. B 56, 13 753 (1997).
9. A. Miyake, H. Kominami, H. Tatsuoka, H. Kuwabara, Y. Nakanishi, and Y. Hatanaka, Univ. Shizuoka, Hamamatsu, Japan (unpublished).
10. K. Torii, T. Deguchi, T. Sota, K. Suzuki, S. Chichibu, and S. Nakamura, Phys. Rev. B 60, 4723 (1999).
11. A. Van der Drift, Philips Res. Rep. 22, 267 (1967).
12. R. Menner, B. Dimmler, R. H. Mauch, and H. W. Schock, J. Cryst. Growth 86, 906 (1988).
13. A. B. M. Almamun Ashrafi, A. Ueta, A. Avramescu, H. Kumano, I. Suemune, Y.-W. Ok, and T.-Y. Seong, Appl. Phys. Lett. 76, 550 (2000).
14. L. Spanel and M. A. Anderson, J. Am. Chem. Soc. 113, 2826 (1991).
15. K. Vanheusden, C. H. Seager, W. L. Warren, D. R. Tallant, and J. A. Voigt, Appl. Phys. Lett. 68, 403 (1996).