Dual tone analysis for phase-plane coverage in ADC metrological characterization

Conference Record - IEEE Instrumentation and Measurement Technology Conference

Volumn 2, Issue , 2003, Pages 1334-1339

  Monteiro, Conceição Libano ^a   Arpaia, Pasquale ^b   Serra, António Cruz ^a  

^a INSTITUTO SUPERIOR TÉCNICO   (Portugal)

^b UNIVERSITY OF SANNIO   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ERROR ANALYSIS; FREQUENCIES; MEASUREMENTS; SIGNAL PROCESSING; ANALOG TO DIGITAL CONVERSION; CALIBRATION; NIOBIUM; SIGNAL ANALYSIS; TESTING; WEBSITES; WORLD WIDE WEB;

DUAL TONE ANALYSIS;

ANALOG TO DIGITAL CONVERSION; QUALITY CONTROL;

ANALOG TO DIGITAL CONVERTERS; ANALYTICAL DESCRIPTION; FIGURE OF MERITS; FREQUENCY; INPUT FREQUENCY; METROLOGICAL CHARACTERIZATION; SAMPLING METHOD; SIGNAL MAPPING;

EID: 0037484092     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (16)

1. P. Arpaia, P. Daponte, S. Rapuano, "A State of the Art on ADC Modeling", Proc. of joined IEE ADDA 2002 Conf. and IMEKO TC-4 Workshop on ADC Modeling and Testing, Prague (CZ), Sep. 2002.
2. P. Arpaia, F. Cennamo, P. Daponte, "Metrological Characterization of Analog-to-digital Converters: A State of the Art", Proc. of IEE ADDA 1999 Conf., Glasgow (UK), Sop, 1999.
3. F.H.Irons, "Dynamic characterization and compensation of analog-to-digital converters", Proc. of IEEE Int. Symp. on Circ. and Sys., May, 1986, pp.1273-1277.
4. T.A.Rebold, F.H.Irons, "A phase-plane approach to the compensation of high-speed analog-to-digital converters", Proc. of IEEE Int. Symp. on Circuits and Systems, May 1987, pp. 455-458.
5. J.Tsimbinos, K.V.Lever, "Applications of higher-order statistics to modelling, identification and cancellation of non-linear distortion in high-speed samplers and analogue-to-digital converters using the Volterra and Wiener methods", Proc. of IEEE Signal Processing Workshop on Higher-Order Statistics, Jun. 1993, pp. 379-383.
6. J.Tsimbinos, K.V.Lever, "Improved error table compensation of analog-to-digital converters using pseudo-random calibration signals", Electronic Letters, vol. 30, No. 6, Mar. 1994, pp-461-462.
7. P.Arpaia, P.Daponte, L.Michaeli, "Analytical a priori approach to phase-plane modeling of SAR A/D converters", IEEE Trans. On Instrum. and Meas., Vol. 47, No.4, Aug. 1998, pp. 849-857.
8. P.Arpaia, P.Daponte, L.Michaeli, "A dynamic error model for integrating analog-to-digital converters", Measurement, Vol. 25, n. 4, Jul. 1999, pp.255-264.
9. A.Baccigalupi, A.Bemieri, C.Liguori, "Error compensation of A/D converters using neural networks", IEEE Trans. on Instrum. and Meas., vol. 45, No. 2, Apr. 1996, pp. 640-644.
10. D.M.Hummels, J.J.McDonald II, F.H.Irons, "Distortion compensation for time-interleaved analog to digital converters", Proc. of IMTC/96, Jun. 1996, pp.728-731.
11. S.Acunto, P.Arpaia, F.H.Irons, D.M.Hummels, "A new bidimensional histogram for the dynamic characterization of ADCs", Proc. of IEEE IMTC 2001, vol.3, May 2001, pp. 2015-2020.
12. J. Blair, "Selecting test frequencies for two-tone phase-plane analysis of ADCs", IEEE Trans. on Instrum. and Meas., Vol. 51, No.5, Oct. 2002, pp. 976-979.
13. M.Benkais, S. Le Masson, P.Marchegay, "A/D converter characterization by spectral analysis in dual-tone mode", IEEE Trans. on Instrum. and Meas., Vol. 44, No.4, Aug. 1995, pp. 940-944.
14. M.T. Abuelma'atti, "Spectrum of a nonlinearly quantised equal-amplitude dual-tone signal", IEEE Proc.- Circ. Dev. Sys., Vol. 148, No.l, Feb. 2001, pp. 11-18.
15. J. Q. Zhang, S. J. Ovaska, "ADC characterization based on singular value decomposition", IEEE Trans. on Instrum. and Meas., Vol. 51, No. 1, Feb. 2002, pp. 138-143.
16. "IEEE 1057 Standard for digitizing waveform recorders", SH94245, Dec. 1994.