ADC characterization based on singular value decomposition

IEEE Transactions on Instrumentation and Measurement

Volumn 51, Issue 1, 2002, Pages 138-143

  Zhang, Jian Qiu ^a,b,c   Ovaska, Seppo J ^a,d  

^a IEEE   (United Kingdom)

^b HARBIN INSTITUTE OF TECHNOLOGY   (China)

^c UNIVERSITY OF GREENWICH   (United Kingdom)

^d AALTO UNIVERSITY   (Finland)

Author keywords

ADC characterization; ADCs effective bits; Analog digital converter; Signal to noise ratio

Indexed keywords

ANALOG TO DIGITAL CONVERTER CHARACTERIZATION; DUAL TONE; EFFECTIVE BITS; MULTITONE; SINGLE TONE; SINGULAR VALUE DECOMPOSITION;

ANALOG TO DIGITAL CONVERSION; COMPUTER SIMULATION; ESTIMATION; SIGNAL TO NOISE RATIO;

ELECTRIC VARIABLES MEASUREMENT;

EID: 0036476891     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/19.989917     Document Type: Article

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