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Volumn , Issue 466, 1999, Pages 134-144
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Metrological characterisation of analog-to-digital converters - a state of the art
a
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Author keywords
[No Author keywords available]
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Indexed keywords
CURVE FITTING;
ERROR ANALYSIS;
FOURIER TRANSFORMS;
INTEGRATED CIRCUIT TESTING;
LEAST SQUARES APPROXIMATIONS;
MATHEMATICAL MODELS;
SPECTRUM ANALYSIS;
STATISTICAL METHODS;
TIME DOMAIN ANALYSIS;
DISCRETE FOURIER TRANSFORM TEST;
FIXED ERRORS;
HISTOGRAM TEST;
LONG TERM STABILITY ERRORS;
SINE FIT TEST;
TIME JITTER ERRORS;
ANALOG TO DIGITAL CONVERSION;
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EID: 0033323971
PISSN: 05379989
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1049/cp:19990482 Document Type: Conference Paper |
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Times cited : (18)
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References (79)
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