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Volumn 163, Issue 164, 2003, Pages 491-498

The contact response of thin Si-C-coated silicon systems-characterisation by nanoindentation

Author keywords

Coated systems; Elastic properties; Nano indentation; Scanning electron microscopy; Silicon carbide

Indexed keywords

CRYSTAL ORIENTATION; DEFORMATION; ELASTIC MODULI; INDENTATION; SCANNING ELECTRON MICROSCOPY; SILICON CARBIDE;

EID: 0037472723     PISSN: 02578972     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0257-8972(02)00647-3     Document Type: Article
Times cited : (24)

References (29)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.