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Volumn 163, Issue 164, 2003, Pages 491-498
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The contact response of thin Si-C-coated silicon systems-characterisation by nanoindentation
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Author keywords
Coated systems; Elastic properties; Nano indentation; Scanning electron microscopy; Silicon carbide
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Indexed keywords
CRYSTAL ORIENTATION;
DEFORMATION;
ELASTIC MODULI;
INDENTATION;
SCANNING ELECTRON MICROSCOPY;
SILICON CARBIDE;
DEFORMATION STRUCTURES;
COATING TECHNIQUES;
CONTACT;
INDENTATION;
INORGANIC COATING;
SILICON;
SILICON CARBIDE;
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EID: 0037472723
PISSN: 02578972
EISSN: None
Source Type: Journal
DOI: 10.1016/S0257-8972(02)00647-3 Document Type: Article |
Times cited : (24)
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References (29)
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