Structural, dielectric and optical properties of highly oriented lead zirconate thin films prepared by sol-gel process

Materials Chemistry and Physics

Volumn 80, Issue 1, 2003, Pages 294-298

  Tang, Zhenfang ^a   Tang, Xingui ^b  

^a JINAN UNIVERSITY   (China)

^b SHANGHAI INSTITUTE OF CERAMICS   (China)

Author keywords

Antiferroelectric; Dielectric properties; Optical properties; Orientated growth; PbZrO3 thin films

Indexed keywords

ANNEALING; ANTIFERROELECTRIC MATERIALS; COERCIVE FORCE; CRYSTALLIZATION; DIELECTRIC PROPERTIES; ELECTRIC FIELD EFFECTS; ELECTRIC POTENTIAL; FILM GROWTH; LEAD COMPOUNDS; OPACITY; QUARTZ; SOL-GELS; SUBSTRATES;

ORIENTED GROWTH;

THIN FILMS;

EID: 0037472183     PISSN: 02540584     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0254-0584(02)00514-X     Document Type: Article

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