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Volumn 379, Issue 1-2, 2000, Pages 72-75
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PZT thin films with preferred-orientation induced by external stress
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Author keywords
[No Author keywords available]
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Indexed keywords
ANNEALING;
ATOMIC FORCE MICROSCOPY;
CRYSTAL MICROSTRUCTURE;
CRYSTALLIZATION;
GRAIN BOUNDARIES;
IMAGE ANALYSIS;
LEAD COMPOUNDS;
SOL-GELS;
STRESS ANALYSIS;
SUBSTRATES;
THIN FILMS;
X RAY CRYSTALLOGRAPHY;
EXTERNAL STRESSES;
DIELECTRIC FILMS;
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EID: 0034496859
PISSN: 00406090
EISSN: None
Source Type: Journal
DOI: 10.1016/S0040-6090(00)01563-7 Document Type: Article |
Times cited : (35)
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References (18)
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