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Volumn 379, Issue 1-2, 2000, Pages 72-75

PZT thin films with preferred-orientation induced by external stress

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; ATOMIC FORCE MICROSCOPY; CRYSTAL MICROSTRUCTURE; CRYSTALLIZATION; GRAIN BOUNDARIES; IMAGE ANALYSIS; LEAD COMPOUNDS; SOL-GELS; STRESS ANALYSIS; SUBSTRATES; THIN FILMS; X RAY CRYSTALLOGRAPHY;

EID: 0034496859     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(00)01563-7     Document Type: Article
Times cited : (35)

References (18)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.