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Volumn 78, Issue 1-4 SPEC., 2003, Pages 149-157

Atomic layer deposition and surface characterization of highly dispersed titania/silica-supported vanadia catalysts

Author keywords

Acidity; Atomic layer deposition; Dispersion; Titania silica supported vanadia catalysts

Indexed keywords

ACIDITY; CALORIMETRY; DEPOSITION; POROSITY; RAMAN SPECTROSCOPY; SILICA; TITANIUM DIOXIDE; VANADIUM COMPOUNDS; X RAY DIFFRACTION ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 0037469694     PISSN: 09205861     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0920-5861(02)00320-6     Document Type: Conference Paper
Times cited : (54)

References (42)
  • 20
    • 0003495856 scopus 로고
    • card no. 9-387, JCPDS International Centre for Diffraction Data, Swartmore
    • F. McClune, Powder Diffraction File, card no. 9-387, JCPDS International Centre for Diffraction Data, Swartmore, 1988, p. 784.
    • (1988) Powder Diffraction File , pp. 784
    • McClune, F.1
  • 21
    • 0003495856 scopus 로고
    • card no. 21-1272, JCPDS International Centre for Diffraction Data, Swartmore
    • F. McClune, Powder Diffraction File, card no. 21-1272, JCPDS International Centre for Diffraction Data, Swartmore, 1988, p. 784.
    • (1988) Powder Diffraction File , pp. 784
    • McClune, F.1
  • 22
    • 0003495856 scopus 로고
    • card no. 27-1318, JCPDS International Centre for Diffraction Data, Swartmore
    • F. McClune, Powder Diffraction File, card no. 27-1318, JCPDS International Centre for Diffraction Data, Swartmore, 1988, p. 784.
    • (1988) Powder Diffraction File , pp. 784
    • McClune, F.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.