Local probing of thermal properties at submicron depths with megahertz photothermal vibrations

Applied Physics Letters

Volumn 82, Issue 4, 2003, Pages 622-624

  Tomoda, M ^a   Shiraishi, N ^a   Kolosov, O V ^b,c   Wright, O B ^a  

^a HOKKAIDO UNIVERSITY   (Japan)

^b UNIVERSITY OF OXFORD   (United Kingdom)

^c SYMYX TECHNOLOGIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; LASER BEAM EFFECTS; OPTICAL FILTERS; OPTICAL MICROSCOPY; PIEZOELECTRIC TRANSDUCERS; THERMODYNAMIC PROPERTIES; ULTRASONICS; VIBRATIONS (MECHANICAL);

OPTICAL HETERODYNE FORCE MICROSCOPY (OHFM);

THIN FILMS;

EID: 0037467965     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1539906     Document Type: Article

References (21)

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21. 1 equal to μαΔT ∼ 3 pm, assuming periodic temperature variations equal to that of the sample (ΔT ∼ 5 K). However, the smaller OHFM signal observed for the one-layer region of the sample, where ΔT is larger, suggests that tip expansion is not dominant.