메뉴 건너뛰기




Volumn 15, Issue 2, 2003, Pages 55-66

Surface photovoltage spectroscopy as a valuable nondestructive characterization technique for GaAs/GaAlAs vertical-cavity surface-emitting laser structures

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON TRANSITIONS; EXCITONS; LIGHT EMISSION; MIS DEVICES; REFLECTOMETERS; SEMICONDUCTING GALLIUM COMPOUNDS; SEMICONDUCTOR DEVICE STRUCTURES; SEMICONDUCTOR QUANTUM WELLS; SPECTROSCOPY; SURFACES; TEMPERATURE;

EID: 0037460360     PISSN: 09538984     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-8984/15/2/306     Document Type: Article
Times cited : (10)

References (27)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.