Reliability improvement of PMZNT relaxor ferroelectrics through surface modification by MnO2 doping against electroplating-induced degradation

Materials Chemistry and Physics

Volumn 78, Issue 2, 2003, Pages 546-550

  Cao, Jiang Li ^a   Li, Long Tu ^a   Gui, Zhi Lun ^a  

^a TSINGHUA UNIVERSITY   (China)

Author keywords

Ceramics; Dielectric properties; Electrical conductivity; Surfaces

Indexed keywords

CERAMIC MATERIALS; CRYSTAL LATTICES; DEGRADATION; DOPING (ADDITIVES); ELECTROPLATING; LEAD COMPOUNDS; PERMITTIVITY; PEROVSKITE; REDOX REACTIONS; SCANNING ELECTRON MICROSCOPY; SURFACE TREATMENT; X RAY DIFFRACTION ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY;

VAPOROUS DOPINGS;

FERROELECTRIC MATERIALS;

EID: 0037449967     PISSN: 02540584     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0254-0584(02)00380-2     Document Type: Article

References (15)

1. Swartz S.L., Shrout T.R., Schulze W.A., Cross L.E. Dielectric properties of lead-magnesium niobate J. Am. Ceram. Soc. 67 1984 311-315.
2. Lejeune M., Boilot J.P. Low firing dielectrics based on lead magnesium niobate Mater. Res. Bull. 20 1985 493-499.
3. Behm D.A., Feltz C.J., Haynes R., Pinault S.C. Statistical determination of plating process variables for multilayer ceramics chip capacitors J. Am. Ceram. Soc. 72 12 1989 2279-2281.
4. Anderson F.R., Haynes R., Pinault S.C. Barrier layer multilayer ceramic capacitor processing: effects of termination and plating process parameters IEEE Trans. Compon. Hybr. Manuf. Technol. 12 4 1989 609-612.
5. Smyth D.M., Harmer M.P., Peng P. Defect chemistry of relaxor ferroelectrics and the implications for dielectric degradation J. Am. Ceram. Soc. 72 1989 2276-2278.
6. Ling H.C., Jackson A.M. Correlation of silver migration with temperature-humidity-bias (THB) failures in multilayer ceramic capacitors IEEE Trans. Compon. Hybr. Manuf. Technol. 12 1989 130-137.
7. Cao J.L., Li L.T., Gui Z.L. An XPS study on the degradation of lead magnesium niobate-based relaxor ferroelectrics during nickel electroplating J. Mater. Chem. 11 2001 1198-1200.
8. Cao J.L., Li L.T., Wang Y.L., Gui Z.L. Resistance degradation of PMN-based ceramics during nickel electroplating and the recovery through air annealing J. Electrochem. Soc. 148 9 2001 F180-F183.
9. Cao J.L., Li L.T., Wang Y.L., Zhao J.Q., Gui Z.L. Hydrogen-induced degradation of PMN-based relaxor ferroelectrics during nickel electroplating Mater. Res. Bull. 36 12 2001 2103-2109.
10. Cao J.L., Li L.T., Wang Y.L., Gui Z.L. Investigation of electroplating-induced degradation of PMZNT relaxor ferroelectrics J. Am. Ceram. Soc. 85 2 2002 476-478.
11. Beck C.M., Thomas N.W., Thompson I. Manganese-doping of lead magnesium niobium titanate: chemical control of dielectric properties J. Eur. Ceram. Soc. 18 1998 1685-1693.
12. Z.L. Gui, Y. Wang, L.T. Li, Lead-based relaxor ferroelectric ceramics for high performance low firing MLCs, in: Proceedings of the 10th IEEE International Symposium on Application of Ferroelectrics, August 18, 1996, pp. 409-412.
13. J.F. Moulder, W.F. Stickle, P.E. Sobol, K.D. Bomben, Handbook of X-ray Photoelectron Spectroscopy, Perkin-Elmer Corporation, USA, October 1992.
14. Shannon R.D. Revised effective ionic radii and systematic studies of interatomic distances in halides and chalcogenides Acta Crystallogr. A 32 1976 751-767.
15. Yamamatsu J., Kawano N., Arashi T., Sato A., Nakano Y., Momura T. Reliability of multilayer ceramic capacitors with nickel electrodes J. Power Sources 60 1996 199-203.