Hydrogen-induced degradation of PMN-based relaxor ferroelectrics during nickel electroplating

Materials Research Bulletin

Volumn 36, Issue 12, 2001, Pages 2103-2109

  Cao, Jiang Li ^a   Li, Long Tu ^a   Wang, Yong Li ^a   Zhao, Jian Qiang ^a   Gui, Zhi Lun ^a  

^a TSINGHUA UNIVERSITY   (China)

Author keywords

A. ceramics; C. photoelectron spectroscopy; D. electrical properties

Indexed keywords

DEGRADATION; ELECTRIC RESISTANCE; ELECTRON ENERGY LEVELS; ELECTROPLATING; IONIC CONDUCTION; NICKEL PLATING; PERMITTIVITY; POSITIVE IONS; X RAY PHOTOELECTRON SPECTROSCOPY;

CONDUCTIVE ELECTRONS; NICKEL ELECTROPLATING;

FERROELECTRIC MATERIALS;

EID: 0035479483     PISSN: 00255408     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0025-5408(01)00697-3     Document Type: Article

References (12)