Optical characterization of the recombination process in silicon wafers, epilayers and devices

Optics and Lasers in Engineering

Volumn 39, Issue 2, 2003, Pages 219-232

  Irace, Andrea ^a   Sirleto, Luigi ^a   Spirito, Paolo ^a   Vitale, Giovanni F ^a   Cutolo, Antonello ^b   Campopiano, S ^c   Zeni, Luigi ^c  

^a UNIVERSITY OF NAPLES FEDERICO II   (Italy)

^b UNIVERSITY OF SANNIO   (Italy)

^c SECOND UNIVERSITY OF NAPLES   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

PARTICLE BEAM INJECTION; POLYSILICON; SEMICONDUCTOR MATERIALS; SILICON WAFERS; THERMAL CYCLING;

EPILAYERS;

SOLAR CELLS;

EID: 0037411972     PISSN: 01438166     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0143-8166(01)00108-7     Document Type: Article

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