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Volumn 76, Issue 6, 2003, Pages 975-978

Recrystallization behavior of high-dose Mn+-implanted GaAs

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTAL LATTICES; CRYSTALLIZATION; ION IMPLANTATION; MANGANESE; POSITIVE IONS; RAMAN SPECTROSCOPY; RAPID THERMAL ANNEALING;

PHONON FREQUENCY;

SEMICONDUCTING GALLIUM ARSENIDE;

EID: 0037389439 PISSN: 09478396 EISSN: None Source Type: Journal
DOI: 10.1007/s00339-002-1960-0 Document Type: Conference Paper

Times cited : (3)

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