Raman probing of thermal damage depth profile in annealed GaAs

Journal of Applied Physics

Volumn 84, Issue 12, 1998, Pages 6588-6591

  Pizani, P S ^a   Campos, C E M ^a  

^a FEDERAL UNIVERSITY OF SÃO CARLOS   (Brazil)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001429084     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.369031     Document Type: Article

References (18)

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