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Volumn 202, Issue , 2003, Pages 1-7
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Finding possible transition states of defects in silicon-carbide and alpha-iron using the dimer method
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Author keywords
Defect migration; Defects and defect clusters; Dimer method; SiC and Fe; Transition states
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Indexed keywords
ACTIVATION ENERGY;
ANNEALING;
DIMERS;
ION IMPLANTATION;
POINT DEFECTS;
POTENTIAL ENERGY;
SILICON CARBIDE;
DEFECT MIGRATION;
NUCLEAR INSTRUMENTATION;
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EID: 0037377426
PISSN: 0168583X
EISSN: None
Source Type: Journal
DOI: 10.1016/S0168-583X(02)01822-0 Document Type: Conference Paper |
Times cited : (24)
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References (19)
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