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Volumn 202, Issue , 2003, Pages 1-7

Finding possible transition states of defects in silicon-carbide and alpha-iron using the dimer method

Author keywords

Defect migration; Defects and defect clusters; Dimer method; SiC and Fe; Transition states

Indexed keywords

ACTIVATION ENERGY; ANNEALING; DIMERS; ION IMPLANTATION; POINT DEFECTS; POTENTIAL ENERGY; SILICON CARBIDE;

EID: 0037377426     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(02)01822-0     Document Type: Conference Paper
Times cited : (24)

References (19)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.