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Volumn 64, Issue 17, 2001, Pages 1741081-17410816

Molecular-dynamics simulation study of threshold displacementsand defect formation in zircon

Author keywords

[No Author keywords available]

Indexed keywords

OXYGEN; SILICON; ZIRCONIUM;

EID: 0035499559     PISSN: 01631829     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (33)

References (53)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.