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Volumn 44, Issue 2, 2003, Pages 143-152
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Modeling of dark characteristics of mercury cadmium telluride n +-p junctions
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Author keywords
[No Author keywords available]
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Indexed keywords
COMPUTER SIMULATION;
ELECTRIC IMPEDANCE;
ION IMPLANTATION;
LEAKAGE CURRENTS;
MERCURY COMPOUNDS;
SEMICONDUCTOR JUNCTIONS;
DARK CURRENTS;
INFRARED DETECTORS;
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EID: 0037376588
PISSN: 13504495
EISSN: None
Source Type: Journal
DOI: 10.1016/S1350-4495(02)00185-8 Document Type: Article |
Times cited : (53)
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References (20)
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