Relationship between deep levels and RoA product in HgCdTe diodes

Opto-Electronics Review

Volumn 9, Issue 4, 2001, Pages 385-390

  Singh, S K ^a   Gopal, V ^a   Mehra, R M ^b  

^a SOLID STATE PHYSICS LABORATORY   (India)

^b UNIVERSITY OF DELHI   (India)

Author keywords

HgCdTe; Trap levels

Indexed keywords

EID: 0000210112     PISSN: 12303402     EISSN: 18963757     Source Type: Journal    
DOI: None     Document Type: Article

References (13)

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