Formation of aluminum oxide thin films on FeAl(1 1 0) studied by STM

Surface Science

Volumn 529, Issue 1-2, 2003, Pages 223-230

  Kizilkaya, O ^a   Hite, D A ^a,c   Zehner, D M ^b   Sprunger, P T ^a  

^a LOUISIANA STATE UNIVERSITY   (United States)

^b OAK RIDGE NATIONAL LABORATORY   (United States)

^c NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

Aluminum; Iron; Metal insulator interfaces; Oxidation; Scanning tunneling microscopy; Surface relaxation and reconstruction

Indexed keywords

ALUMINA; ANNEALING; ELECTRONIC STRUCTURE; OXIDATION; SCANNING TUNNELING MICROSCOPY; STOICHIOMETRY; ULTRATHIN FILMS;

SURFACE RELAXATION;

SURFACE REACTIONS;

EID: 0037376481     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(03)00271-1     Document Type: Article

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