Bent-fiber near-field scanning optical microscopy probes for use with commercial atomic force microscopes

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3009, Issue , 1997, Pages 119-129

  Taylor, Roderick S ^a   Leopold, Kurt E ^a   Wendman, Mark A ^b   Gurley, Gus ^b   Elings, Virgil B ^b  

^a NATIONAL RESEARCH COUNCIL CANADA   (Canada)

^b Digital Instruments   (United States)

Author keywords

AFM; Bent fiber; Evanescent fields; Near field; NSOM probes; Optical waveguides

Indexed keywords

ATOMIC FORCE MICROSCOPY; ATOMIC PHYSICS; COMPOSITE MICROMECHANICS; FIBERS; INTEGRATED OPTOELECTRONICS; MACHINING; MICROMACHINING; OPTICAL DATA STORAGE; OPTICAL FIBERS; OPTICAL INSTRUMENTS; OPTICAL MICROSCOPY; OPTICAL WAVEGUIDES; PROBES; SCANNING; WAVEGUIDES;

AFM; BENT FIBER; EVANESCENT FIELDS; NEAR-FIELD; NSOM PROBES;

NEAR FIELD SCANNING OPTICAL MICROSCOPY;

EID: 0012895188     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.271220     Document Type: Conference Paper

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