Influence of boundary roughness on the magnetization reversal in submicron sized magnetic tunnel junctions

Journal of Applied Physics

Volumn 93, Issue 5, 2003, Pages 2676-2680

  Meyners, D ^a   Bruckl H ^a   Reiss, G ^a  

^a BIELEFELD UNIVERSITY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; COMPUTER SIMULATION; MAGNETIC DEVICES; MAGNETIZATION; NUCLEATION; SWITCHING;

MAGNETIC TUNNEL JUNCTIONS (MTJ);

TUNNEL JUNCTIONS;

EID: 0037351432     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1544424     Document Type: Article

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