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Surface and Interface Analysis

Volumn 35, Issue 3, 2003, Pages 287-293

Determination of photoelectron attenuation lengths in calcium phosphate ceramic films using XPS and RBS

(4) Feddes, B a,c Vredenberg, A M b Wolke, J G C a Jansen, J A a

a RADBOUD UNIVERSITY NIJMEGEN (Netherlands)

b UTRECHT UNIVERSITY (Netherlands)

c RADBOUD UNIVERSITY MEDICAL CENTER (Netherlands)

Author keywords

Calcium phosphate ceramic; Electron attenuation length; Rutherford backscattering spectrometry; X ray photoelectron spectroscopy

Indexed keywords

CALCIUM COMPOUNDS; COMPOSITION; OXYGEN; RUTHERFORD BACKSCATTERING SPECTROSCOPY; THIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY;

PHOTOELECTRON ATTENUATION;

PROTECTIVE COATINGS;

EID: 0037343238 PISSN: 01422421 EISSN: None Source Type: Journal
DOI: 10.1002/sia.1531 Document Type: Article

Times cited : (8)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.