A new method for estimating the aperture uncertainty of A/D converters

IEEE Transactions on Instrumentation and Measurement

Volumn 47, Issue 1, 1998, Pages 61-64

  Chiorboli, Giovanni ^a,b   Fontanili, Massimo ^b   Morandi, Carlo ^a,b  

^a IEEE   (Italy)

^b UNIVERSITY OF PARMA   (Italy)

Author keywords

Analog digital conversion; Aperture uncertainty; Noise measurement; Phase jitter; Timing jitter

Indexed keywords

SIGNAL NOISE MEASUREMENT; SPURIOUS SIGNAL NOISE; TESTING;

APERTURE UNCERTAINTY; PHASE JITTER; QUANTIZATION; TIMING JITTER;

ANALOG TO DIGITAL CONVERSION;

EID: 0031988350     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/19.728790     Document Type: Article

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