Topographic characterization and electrostatic response of M-DNA studied by atomic force microscopy

Nanotechnology

Volumn 14, Issue 2, 2003, Pages 128-133

  Moreno Herrero, F ^a   Herrero, P ^b   Moreno, F ^b   Colchero, J ^a   Gomez Navarro C ^a   Gomez Herrero J ^a   Baro A M ^a  

^a UNIVERSIDAD AUTÓNOMA DE MADRID   (Spain)

^b UNIVERSITY OF OVIEDO   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; COBALT COMPOUNDS; CONDENSATION; ELECTROPHORESIS; ELECTROSTATICS; MICA; MOLECULES; NICKEL COMPOUNDS; POSITIVE IONS;

BIOMOLECULE; METALLIC ION; MODIFIED DNA; MOLECULAR WIRE;

DNA;

EID: 0037293016     PISSN: 09574484     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-4484/14/2/305     Document Type: Article

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