Novel compositional accommodation mechanism in SrNbO3 epitaxial thin films revealed by analytical electron microscopy

Surface and Interface Analysis

Volumn 35, Issue 1, 2003, Pages 29-35

  Takeno, S ^a   Ohara, R ^a   Sano, K ^a   Kawakubo, T ^a  

^a TOSHIBA CORPORATION   (Japan)

Author keywords

Accommodation; AEM; EDX; Planar defect; SrNbO3

Indexed keywords

AMORPHOUS MATERIALS; BORON; COMPOSITION; DEFECTS; ELECTRON MICROSCOPY; EMISSION SPECTROSCOPY; ENERGY DISPERSIVE SPECTROSCOPY; INDUCTIVELY COUPLED PLASMA; IONS; PEROVSKITE; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY;

ANALYTICAL ELECTRON MICROSCOPY; COMPOSITIONAL ACCOMMODATION MECHANISM; EPITAXIAL THIN FILMS; PLANAR FAULTS;

STRONTIUM COMPOUNDS;

EID: 0037259391     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/sia.1488     Document Type: Article

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