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Journal of Electron Microscopy

Volumn 50, Issue 2, 2001, Pages 89-96

Measurement of electron beam broadening in stainless steels during EDS analysis in the FEG-TEM

(3) Nakata, K b Okada, O a Ueki, Y a

a HITACHI LTD (Japan)

b NIPPON NUCLEAR FUEL DEVELOPMENT CO LTD (Japan)

Author keywords

EDS; Electron beam broadening; FEG TEM; Foil thickness; Spatial resolution; Stainless steel

Indexed keywords

ARTICLE;

AUSTENITIC STAINLESS STEEL; ELECTRONS; IMAGE RESOLUTION;

316L; BEAM BROADENING; EDS ANALYSIS; ELECTRON BEAM BROADENING; ELECTRON-BEAM; FEG-TEM; FOIL THICKNESS; MEASUREMENTS OF; SPATIAL RESOLUTION; TYPE 316L STAINLESS STEEL;

ELECTRON BEAMS;

EID: 0035024716 PISSN: 00220744 EISSN: None Source Type: Journal
DOI: 10.1093/jmicro/50.2.89 Document Type: Article

Times cited : (4)

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