Isotopic metrology of carbon dioxide. II. Effects of ion source materials, conductance, emission, and accelerating voltage on dual-inlet cross contamination

Rapid Communications in Mass Spectrometry

Volumn 17, Issue 8, 2003, Pages 777-782

  Verkouteren, R Michael ^a   Assonov, Sergey ^b   Klinedinst, Donna B ^a   Brand, Willi A ^c  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b MAX PLANCK INSTITUTE FOR CHEMISTRY   (Germany)

^c MAX PLANCK INSTITUTE FOR BIOGEOCHEMISTRY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ACCELERATION; CARBON DIOXIDE; CONTAMINATION; ELECTRON EMISSION; ION IMPLANTATION; ISOTOPES; MASS SPECTROMETRY;

ACCELERATING VOLTAGES; CARBON DIOXIDE MEASUREMENTS; CROSS CONTAMINATION; EFFECT OF IONS; EQUILIBRATION TIME; GAS-ISOTOPE RATIO MASS SPECTROMETRY; HIGH-PRECISION; ISOTOPE-RATIO MASS SPECTROMETRY; NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY; SOURCE MATERIAL;

ION SOURCES;

ACCELERATION; ACCURACY; ADSORPTION; CARBON DIOXIDE MEASUREMENT; CONDUCTANCE; CONFERENCE PAPER; ELECTRIC POTENTIAL; MACHINE; MASS SPECTROMETRY; MEASUREMENT; PERFORMANCE; PRESSURE;

EID: 0037255578     PISSN: 09514198     EISSN: None     Source Type: Journal    
DOI: 10.1002/rcm.906     Document Type: Conference Paper

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