An RC network analysis of long term Ti:LiNbO3 bias stability

Journal of Lightwave Technology

Volumn 14, Issue 12, 1996, Pages 2687-2697

  Korotky, Steven K ^a,b,c,d,e,f   Veselka, John J ^b,g  

^a IEEE

^b LUCENT TECHNOLOGIES   (United States)

^c RUTGERS UNIVERSITY   (United States)

^d YALE UNIVERSITY   (United States)

^e Intgd Photonics Research Conference

^f AMERICAN PHYSICAL SOCIETY   (United States)

^g BINGHAMTON UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC NETWORK ANALYSIS; ELECTRIC PROPERTIES; ELECTRODES; ELECTROOPTICAL DEVICES; EQUIVALENT CIRCUITS; LITHIUM COMPOUNDS; OPTICAL WAVEGUIDES; RELIABILITY; SEMICONDUCTOR DEVICE STRUCTURES; TESTING;

ELECTROOPTIC MODULATORS; RESISTOR CAPACITOR CIRCUIT MODEL;

LIGHT MODULATORS;

EID: 0030394718     PISSN: 07338724     EISSN: None     Source Type: Journal    
DOI: 10.1109/50.545788     Document Type: Article

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