Composite uniaxial bianisotropic chiral materials characterization: Comparison of predicted and measured scattering

Journal of Electromagnetic Waves and Applications

Volumn 11, Issue 3, 1997, Pages 371-394

  Whites, Keith W ^a   Chung, Chee Yee ^b  

^a UNIVERSITY OF KENTUCKY   (United States)

^b Intel Technology Malaysia Sdn Bhd   (Malaysia)

Author keywords

[No Author keywords available]

Indexed keywords

CHARACTERIZATION; COMPUTATIONAL METHODS; DIELECTRIC MATERIALS; ELECTROMAGNETIC FIELD THEORY; ELECTROMAGNETIC WAVE SCATTERING; NUMERICAL ANALYSIS; PARAMETER ESTIMATION;

ALIGNED HELICES; BIANISOTROPIC CHIRAL MATERIALS; DEGREE OF MUTUAL COUPLING; FREE SPACE MEASUREMENT;

COMPOSITE MATERIALS;

EID: 0030710641     PISSN: 09205071     EISSN: 15693937     Source Type: Journal    
DOI: 10.1163/156939397X00288     Document Type: Article

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