Synchrotron radiation studies of inorganic-organic semiconductor interfaces

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 199, Issue , 2003, Pages 475-480

  Evans, D A ^a   Steiner, H J ^a   Vearey Roberts, A R ^a   Bushell, A ^a   Cabailh, G ^b   O'Brien, S ^b   Wells, J W ^b   McGovern, I T ^b   Dhanak, V R ^c   Kampen, T U ^d   Zahn, D R T ^d   Batchelor, D ^e  

^a ABERYSTWYTH UNIVERSITY   (United Kingdom)

^b TRINITY COLLEGE DUBLIN   (Ireland)

^c DARESBURY LABORATORY   (United Kingdom)

^d CHEMNITZ UNIVERSITY OF TECHNOLOGY   (Germany)

^e HAHN MEITNER INSTITUT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION SPECTROSCOPY; CHEMICAL BONDS; OPTOELECTRONIC DEVICES; PHOTOELECTRON SPECTROSCOPY; SEMICONDUCTING ORGANIC COMPOUNDS; SYNCHROTRON RADIATION; X RAY SPECTROSCOPY;

X RAY STANDING WAVE SPECTROSCOPY;

SEMICONDUCTOR JUNCTIONS;

EID: 0037244167     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(02)01595-1     Document Type: Conference Paper

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