De-embedding of reverse recovery losses in fast switching VRM applications

Conference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC

Volumn 2, Issue , 2003, Pages 958-963

  Tolle, Tobias ^a   Duerbaum, Thomas ^a   Elferich, Reinhold ^a  

^a PHILIPS RESEARCH LABORATORIES   (Germany)

Author keywords

Capacitive current; De embedding; Gate bouncing; Half bridge; MOSFET characterisation; Reverse recovery; Switching behaviour; Synchronous rectification; VRM

Indexed keywords

ELECTRIC CONVERTERS; ELECTRIC POWER SYSTEMS; MOSFET DEVICES; SWITCHING THEORY;

REVERSE RECOVERY LOSSES;

ELECTRIC LOSSES;

EID: 0037230646     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)

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