MOS transistors characterization by split C-V method

Proceedings of the International Semiconductor Conference, CAS

Volumn 2, Issue , 2001, Pages 503-506

  Mileusnic, Sasa ^a   Zivanov, Milos ^a   Habas, Predrag ^a  

^a UNIVERSITY OF NOVI SAD   (Serbia)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CAPACITANCE; COMPUTER SIMULATION; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC VARIABLES MEASUREMENT; GATES (TRANSISTOR); IRRADIATION; NUMERICAL ANALYSIS; SPECTRUM ANALYSIS;

NUMERICAL QUASI-ANALYSIS; SIGNAL AC ANALYSIS; SPLIT C-V METHOD;

MOSFET DEVICES;

EID: 0035744134     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (19)