Dynamics of reverse recovery of high-power P-i-N diodes

IEEE Transactions on Electron Devices

Volumn 43, Issue 1, 1996, Pages 142-149

  Pendharkar, Sameer P ^a,b   Trivedi, Malay ^a,b   Shenai, Krishna ^a,b  

^a UNIVERSITY OF WISCONSIN MADISON   (United States)

^b University of Illinois at Chicago   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC CURRENTS; ELECTRIC WAVEFORMS; FINITE ELEMENT METHOD; INTEGRATED CIRCUIT TESTING; NUMERICAL METHODS; SEMICONDUCTING SILICON;

INDUCTIVE SWITCHING; RESISTIVE SWITCHING; REVERSE RECOVERY MEASUREMENT; STATIC MEASUREMENTS; TWO DIMENSIONAL GRID STRUCTURE;

SEMICONDUCTOR DIODES;

EID: 0029769106     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/16.477605     Document Type: Article

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