Channeling effects in heavy-ion irradiated NiAl (100) single-crystals: A TEM assessment in cross-section geometry using weak-beam imaging

Solid State Communications

Volumn 125, Issue 3-4, 2003, Pages 195-199

  De Almeida, P ^a,b   Victoria, M ^a  

^a EPFL   (Switzerland)

^b AGFA GEVAERT N V   (Belgium)

Author keywords

A. Intermetallics; C. Transmission electron microscopy; D. Radiation effects; E. Atom, molecule, and ion impact

Indexed keywords

COMPUTER SIMULATION; CRYSTALLOGRAPHY; HEAVY IONS; INTERMETALLICS; RADIATION EFFECTS; SINGLE CRYSTALS; TRANSMISSION ELECTRON MICROSCOPY;

HEAVY-ION IRRADIATION;

NICKEL COMPOUNDS;

EID: 0037229903     PISSN: 00381098     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0038-1098(02)00722-6     Document Type: Article

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