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Volumn 247, Issue 3-4, 2003, Pages 623-630

Origin of positive charging of nanometer-sized clusters generated during thermal evaporation of copper

Author keywords

A1. Charged clusters; A1. Evaporation; A1. Surface ionization; A3. Thin film growth; B1. Copper

Indexed keywords

ACTIVATION ENERGY; COPPER; EVAPORATION; IONIZATION; NANOSTRUCTURED MATERIALS; SURFACE PHENOMENA; THERMOANALYSIS; THIN FILMS;

EID: 0037212459     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(02)02058-4     Document Type: Article
Times cited : (22)

References (32)
  • 7
    • 0012001672 scopus 로고    scopus 로고
    • MS Thesis, Department of Metallurgy and Engineering, Chunbuk University, Chunju
    • K.S. Seo, MS Thesis, Department of Metallurgy and Engineering, Chunbuk University, Chunju 1998, p. 40.
    • (1998) , pp. 40
    • Seo, K.S.1
  • 9
    • 0002851723 scopus 로고    scopus 로고
    • H.I. Yoo, S.J.L. Kang (Eds.), The Institute of Materials, London
    • N.M. Hwang, I.D. Jeon, D.Y. Kim, in: H.I. Yoo, S.J.L. Kang (Eds.), Ceramic Interfaces, Vol. 2, The Institute of Materials, London 2001, p. 85.
    • (2001) Ceramic Interfaces , vol.2 , pp. 85
    • Hwang, N.M.1    Jeon, I.D.2    Kim, D.Y.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.