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Volumn 201, Issue 1-4, 2002, Pages 171-181
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Growth and thermal annealing of Cu on HfSiO4
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Author keywords
Growth; HfSiO4; Thermal annealing
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Indexed keywords
ANNEALING;
ATOMIC FORCE MICROSCOPY;
COMPUTER SIMULATION;
COPPER;
DEPOSITION;
GROWTH (MATERIALS);
INTERFACES (MATERIALS);
STRAIN;
SYNTHESIS (CHEMICAL);
X RAY PHOTOELECTRON SPECTROSCOPY;
LOW-ENERGY ION SCATTERING (LEIS);
HAFNIUM COMPOUNDS;
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EID: 0037202590
PISSN: 01694332
EISSN: None
Source Type: Journal
DOI: 10.1016/S0169-4332(02)00885-1 Document Type: Article |
Times cited : (2)
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References (17)
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