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Volumn 201, Issue 1-4, 2002, Pages 171-181

Growth and thermal annealing of Cu on HfSiO4

Author keywords

Growth; HfSiO4; Thermal annealing

Indexed keywords

ANNEALING; ATOMIC FORCE MICROSCOPY; COMPUTER SIMULATION; COPPER; DEPOSITION; GROWTH (MATERIALS); INTERFACES (MATERIALS); STRAIN; SYNTHESIS (CHEMICAL); X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 0037202590     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(02)00885-1     Document Type: Article
Times cited : (2)

References (17)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.