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Volumn 93, Issue 1-3, 2002, Pages 31-34

Growth and characterization of high-quality 10-period AlGaN/GaN Bragg reflectors grown by molecular beam epitaxy

Author keywords

Bragg reflector; Molecular beam epitaxy; Nitrides; Reflectivity

Indexed keywords

ATOMIC FORCE MICROSCOPY; CAVITY RESONATORS; COMPUTER SIMULATION; CRACKS; GALLIUM NITRIDE; LIGHT EMITTING DIODES; MIRRORS; MOLECULAR BEAM EPITAXY; OPTICAL COMMUNICATION; SEMICONDUCTING ALUMINUM COMPOUNDS; SEMICONDUCTOR SUPERLATTICES; STRUCTURAL ANALYSIS; SURFACE ROUGHNESS; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0037198523     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-5107(02)00033-8     Document Type: Conference Paper
Times cited : (3)

References (13)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.