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Volumn 192, Issue 1-4, 2002, Pages 72-87
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Surface chemistry associated with plasma etching processes
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Author keywords
Ion bombardment; Molecular dynamics; Plasma etching; Silicon; Surface chemistry
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Indexed keywords
ADSORPTION;
COMPUTER SIMULATION;
ION BOMBARDMENT;
MOLECULAR DYNAMICS;
RECRYSTALLIZATION (METALLURGY);
SEMICONDUCTING SILICON;
SURFACE CHEMISTRY;
ION-INDUCED DAMAGES;
PLASMA ETCHING;
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EID: 0037198346
PISSN: 01694332
EISSN: None
Source Type: Journal
DOI: 10.1016/S0169-4332(02)00021-1 Document Type: Conference Paper |
Times cited : (55)
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References (32)
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