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Volumn 192, Issue 1-4, 2002, Pages 72-87

Surface chemistry associated with plasma etching processes

Author keywords

Ion bombardment; Molecular dynamics; Plasma etching; Silicon; Surface chemistry

Indexed keywords

ADSORPTION; COMPUTER SIMULATION; ION BOMBARDMENT; MOLECULAR DYNAMICS; RECRYSTALLIZATION (METALLURGY); SEMICONDUCTING SILICON; SURFACE CHEMISTRY;

EID: 0037198346     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(02)00021-1     Document Type: Conference Paper
Times cited : (55)

References (32)
  • 1
    • 0005742148 scopus 로고    scopus 로고
    • Scientific American, January
    • (1998) , pp. 56-61
    • Barrett, C.R.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.