Optical anisotropy and strain-induced birefringence in dislocation-free silicon single crystals

Materials Science and Engineering: B

Volumn 91-92, Issue , 2002, Pages 174-177

  Chu, Tao ^a   Yamada, Masayoshi ^a   Donecker, Joerg ^b   Rossberg, Matthias ^b   Alex, Volker ^b   Riemann, Helge ^b  

^a KYOTO INSTITUTE OF TECHNOLOGY   (Japan)

^b LEIBNIZ INSTITUTE FOR CRYSTAL GROWTH   (Germany)

Author keywords

Birefringence; Dislocation free; Optical anisotropy; Point defect; Silicon; SIRP

Indexed keywords

ANISOTROPY; BIREFRINGENCE; CRYSTAL GROWTH; DISLOCATIONS (CRYSTALS); LIGHT POLARIZATION; POINT DEFECTS; SINGLE CRYSTALS; STRAIN;

OPTICAL ANISOTROPY;

SILICON;

EID: 0037197423     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-5107(01)00986-2     Document Type: Conference Paper

References (8)