SCOPUS 정보 검색 플랫폼

Volumn 115, Issue 2, 2001, Pages 1086-1094

Determination of structural parameters characterizing thin films by optical methods: A comparison between scanning angle reflectometry and optical waveguide lightmode spectroscopy

(7) Picart, C a Ladam, G b Senger, B a Voegel, J C a Schaaf, P b Cuisinier, F J G a Gergely, C a

a INSERM (France)

b INSTITUT CHARLES SADRON (France)

Author keywords

[No Author keywords available]

Indexed keywords

ADSORPTION; MATHEMATICAL MODELS; MONOLAYERS; MULTILAYERS; OPTICAL WAVEGUIDES; POLYELECTROLYTES; REFLECTOMETERS; REFRACTIVE INDEX; SPECTROSCOPY;

OPTICAL WAVEGUIDE LIGHTMODE SPECTROSCOPY (OWLS); SCANNING ANGLE REFLECTOMETRY (SAR);

THIN FILMS;

EID: 0035827748 PISSN: 00219606 EISSN: None Source Type: Journal
DOI: 10.1063/1.1375156 Document Type: Article

Times cited : (138)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.