Carbon Buckypaper field emission investigations

Vacuum

Volumn 69, Issue 1-3, 2002, Pages 333-338

  Knapp, Wolfram ^a   Schleussner, D ^a  

^a OTTO VON GUERICKE UNIVERSITY   (Germany)

Author keywords

Carbon nanotubes; Electron source; Field electron emission; Field emission characterization; Field emitter; Vacuum microelectronics

Indexed keywords

CARBON; CARBON NANOTUBES; COLD CATHODE TUBES; CURRENT DENSITY; ELECTRIC DISCHARGES; ELECTRIC FIELDS; ELECTRON SOURCES; IONIZATION; LUMINESCENCE; MICROELECTRONICS; STRESS ANALYSIS; THRESHOLD VOLTAGE;

FIELD EMITTERS;

FIELD EMISSION CATHODES;

EID: 0037168573     PISSN: 0042207X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0042-207X(02)00354-8     Document Type: Conference Paper

References (18)

1. Edelmann C., Iwert T., Kauert R., Knapp W., Merten F. J Vac Soc Japan. 34:1994;686.
2. Kieler O., Biehl St., Kauert R., Knapp W., Edelmann C. Vacuum. 47:1996;375.
3. Donkov N., Knapp W. Meas Sci Technol. 8:1997;798.
4. Knapp W., Edelmann C. Vacuum. 49:1998;1.
5. Kauert R, Kieler O, Biehl St, Knapp W, Edelmann C, Wilfert St. Vacuum 1998;49:53.
6. Kauert R. Doctor thesis, Otto-von-Guericke-Universitaet, Magdeburg, 1997.
7. Kieler O. Doctor thesis, Otto-von-Guericke-Universitaet, Magdeburg, 1998.
8. Baptist R., Bieth C., Py C. J Vac Sci Technol B. 14:1996;2119.
9. Baptist R. Vacuum. 48:1997;723.
10. Ogiwara N., Suganuma K., Miyo Y. Appl Surf Sci. 146:1999;234.
11. Choi W.B., Chung D.S., Kang J.H., Kim H.Y., Jin Y.W., Han I.T., Lee Y.H., Jung J.E., Lee N.S., Park G.S., Kim J.M. Appl Phys Lett. 75:1999;3129.
12. Saito Y., Uemura S. Carbon. 38:2000;169.
13. Cheng LC. International Topical Meeting on Field Electron Emission from Carbon Materials (ITM-FEECM), 2-4 July 2001, Moscow, Russia.
14. http://www.carbolex.com.
15. Knapp W., Bischoff L., Teichert J. Appl Surf Sci. 146:1999;134.
16. Bonard J.M., Salvetat J.B., Stöckli T., de Herr W.A. Appl Phys Lett. 73:1998;918.
17. Gröning O., Küttel O.M., Emmenegger Ch., Gröning P., Schlapbach L. J Vac Sci Technol B. 18:2000;665.
18. Bonard J.-M., Kind H., Stöckli T., Nilsson L.-O. Solid State Electron. 45(6):2001;893-914.