Investigations on Ta2O5/ZnO insulator-semiconductor interfaces

Electronics Letters

Volumn 38, Issue 22, 2002, Pages 1390-1392

  Nandi, S K ^a   Choi, W K ^b   Noh, Y S ^b   Oh, M S ^b   Maikap, S ^c   Hwang, N M ^c   Kim, D Y ^c   Chatterjee, S ^a   Samanta, S K ^a   Maiti, C K ^a  

^a INDIAN INSTITUTE OF TECHNOLOGY   (India)

^b Korea Institute of Science and Technology   (South Korea)

^c Seoul National University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE MEASUREMENT; ELECTRIC CONDUCTANCE; ENERGY GAP; INTERFACES (MATERIALS); PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; TANTALUM COMPOUNDS; THIN FILMS; VOLTAGE MEASUREMENT; ZINC OXIDE;

CHARGE TRAPPING;

MIS DEVICES;

EID: 0037168211     PISSN: 00135194     EISSN: None     Source Type: Journal    
DOI: 10.1049/el:20020944     Document Type: Article

References (10)

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