Current mechanisms in silicon PIN structures processed with various technologies

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 492, Issue 3, 2002, Pages 411-422

  Ruzin, A ^a   Marunko, S ^a  

^a TEL AVIV UNIVERSITY   (Israel)

Author keywords

Carrier generation; Leakage current; PIN structures; Silicon detectors

Indexed keywords

ACTIVATION ENERGY; CAPACITANCE; CURRENT VOLTAGE CHARACTERISTICS; LEAKAGE CURRENTS; SILICON WAFERS;

SILICON DETECTORS;

NUCLEAR INSTRUMENTATION;

EID: 0037152354     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(02)01369-4     Document Type: Article

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