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Volumn 82, Issue 11, 2002, Pages 1267-1274

Photoinduced defects in wide-gap materials: Hydrogenated amorphous silicon-carbon and silicon-nitrogen films

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0037143357     PISSN: 13642812     EISSN: None     Source Type: Journal    
DOI: 10.1080/13642810208223163     Document Type: Article
Times cited : (4)

References (23)
  • 12
    • 0039203104 scopus 로고
    • edited by S. B. Bibyk, V. J. Kapoor and N. S. Alvi Pennington, New Jersey: Electro chemical Society
    • Kapoor, V. J., and Turi, R. A., 1989, Proceedings of the Electro chemical Society, Vol. 89-7, edited by S. B. Bibyk, V. J. Kapoor and N. S. Alvi (Pennington, New Jersey: Electro chemical Society) p. 19.
    • (1989) Proceedings of the Electro Chemical Society , vol.89-7 , pp. 19
    • Kapoor, V.J.1    Turi, R.A.2
  • 13
    • 0042182906 scopus 로고
    • Materials Research Society Symposium Proceedings, Pittsburgh, Pennsylvania: Materials Research Society
    • Li, Y., Catalano, A., and Fieselmann, B. F, 1992, Amorphous Silicon Technology-1992, Materials Research Society Symposium Proceedings, Vol. 258 (Pittsburgh, Pennsylvania: Materials Research Society), p. 923.
    • (1992) Amorphous Silicon Technology-1992 , vol.258 , pp. 923
    • Li, Y.1    Catalano, A.2    Fieselmann, B.F.3
  • 14
    • 11644266195 scopus 로고
    • Materials Research Society Symposium Proceedings, Pittsburgh, Pennsylvania: Materials Research Society
    • Li, Y. M., 1993, Amorphous Silicon Technology-1993, Materials Research Society Symposium Proceedings, Vol. 258 (Pittsburgh, Pennsylvania: Materials Research Society), p. 803.
    • (1993) Amorphous Silicon Technology-1993 , vol.258 , pp. 803
    • Li, Y.M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.