Origins of field enhancement in electron field emission from ion beam synthesized SiC payers

Applied Physics Letters

Volumn 81, Issue 21, 2002, Pages 3942-3944

  Tsang, W M ^a   Wong, S P ^a   Lindner, J K N ^b  

^a CHINESE UNIVERSITY OF HONG KONG   (Hong Kong)

^b UNIVERSITY OF AUGSBURG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS FILMS; ANNEALING; ATOMIC FORCE MICROSCOPY; CARBONIZATION; ION BEAMS; SILICON CARBIDE; SYNTHESIS (CHEMICAL);

CARBON IMPLANTATION;

ELECTRON EMISSION;

EID: 0037132203     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1520715     Document Type: Article

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